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Spectral reflectances have been calculated by accepted methods for water cloud layers having various microphysical properties.
We show that spectral reflectance measurements carried out with realistic accuracy at wavelengths free from interference by absorbers other than water, can yield information about scaled optical thickness [τ′=(1−gτ] and mean drop radius R̄
Spectral reflectances have been calculated by accepted methods for water cloud layers having various microphysical properties.
We show that spectral reflectance measurements carried out with realistic accuracy at wavelengths free from interference by absorbers other than water, can yield information about scaled optical thickness [τ′=(1−gτ] and mean drop radius R̄
| All Time | Past Year | Past 30 Days | |
|---|---|---|---|
| Abstract Views | 0 | 0 | 0 |
| Full Text Views | 202 | 58 | 3 |
| PDF Downloads | 72 | 38 | 0 |
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